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Method Of And Device For Inspecting Images To Detect Defects

總結

The Present Invention Relates To A Method For Automated Defect Detection In Textured Materials. The Present Invention Utilizes Linear Finite Impulse Response (Fir) Filters With Optimized Energy Separation. Specifically, The Invention Provides A Method Of Inspecting Industrial Products For Defects. The Method Has Steps Of: Automated Design Of Optimized Filters From Samples Of Products, Using These Optimal Filters To Filter The Acquired Images Of Product Under Inspection, Computing The Energy Of Each Pixel In A Local Region, And Finally Segmenting The Defect By Thresholding Each Pixel. The Present Invention Also Relates To A Method Of Inspection Of Unknown (Unsupervised) Defects In Web Materials. In An Unsupervised Inspection, Information From A Finite Number Of Optimal Filters Is Combined Using A Data Fusion Module.; This Module Attempts To Nullify The False Alarm Associated With The Information Arriving From Different Channels.

附加資料

Patent Number: HK1042944A1
Application Number: HK2002104647A
Inventor: PANG KWOK-HUNG GRANTHAM | KUMAR AJAY
Priority Date: 18 Apr 2000
Priority Number: HK1042944A1
Application Date: 21 Jun 2002
Publication Date: 30 Jan 2009
IPC Current: G01N0021898
Assignee Applicant: The University of Hong Kong
Title: Method of and device for inspecting images to detect defects
Usefulness: Method of and device for inspecting images to detect defects

主要類別

紡織/服裝

細分類別

織品工程

申請號碼

US2001837065A

國家/地區

香港