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Microwave and Millimeter Wave Camera

IP Title
Microwave and Millimeter Wave Imaging System
Detailed Technology Description
None
Supplementary Information
Inventor: Zoughi, Reza | AbouKhousa, Mohamed Ahmed | Ghasr, Mohammad Tayeb Ahmad | Kharkivskiy, Sergiy | Pommerenke, David
Priority Number: US7746266B2
IPC Current: G01S001389
US Class: 342022 | 342179
Assignee Applicant: The Curators of the University of Missourilumbia
Title: Microwave and millimeter wave imaging system
Usefulness: Microwave and millimeter wave imaging system
Summary: Microwave and millimeter wave imaging system for generating multi-dimensional such as two-dimensional or three-dimensional image of an object.
Novelty: Microwave and millimeter wave imaging system for generating e.g. two-dimensional image of object, has processor generating multi-dimensional profile representative of object in defined spatial domain, and display displaying image of profile
Industry
Biomedical
Sub Category
Medical Imaging
Application Date
Mar 6, 2008
Application No.
7,746,266
Others
*Abstract
A microwave and millimeter wave one-shot imaging system or camera for rapid imaging of an object using an array of modulated slot antennas is disclosed. The array measures the electric field scattered by the obiect at a sufficient number of discrete locations corresponding to a certain spatial domain (e.g., a portion of plane be it planar, cylindrical, spherical or arbitrarily shaped) located away from the object. The use of the slots modulated by active elements such as diodes (e.g., PIN diodes) or by other means and their arrangement provides for high measurement sensitivity and spatial resolution associated with the array elements at higher frequencies. The array is subsequently integrated with other system components including the RF transmitter and receiver circuits, processor, and display. Using special processing of the measurements at the discrete locations, 2D or 3D images of the object's spatial and/or dielectric profiles can be generated (e.g., holographical images). The slot antennas incorporated into the array may take various designs (e.g., sub-resonant slots, resonant slots) depending on the application. The array may have the ability to measure electric field at different polarizations that may increase the amount of geometrical and materials information revealed about the imaged object. The array may be slightly displaced in two orthogonal directions to increase the number of samples obtained per wavelength resulting in increased spatial resolution of the system. For instance, the displacement can be just a quarter-wavelength. When built with linearly polarized modulated slots, the electric field in the orthogonal direction can be still measured by rotating the array 90 degrees.
*IP Issue Date
Jun 29, 2010
*IP Publication Date
Sep 24, 2009
*Principal Investigator

Name: Reza Zoughi, Professor

Department:


Name: Mohamed AbouKhousa, Graduate Student

Department:


Name: Mohammad Ghasr, Graduate Student - PhD

Department:


Name: Sergiy Kharkivskiy, Res. Assoc Professor

Department:


Name: David Pommerenke, Assoc Professor

Department:

Country/Region
USA

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